Structural and Electrical Properties of Pb0.5Ba0.5TiO3Thin Film Using a Chemical Solution Deposition Method
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Structural and Electrical Properties of Pb0.5Ba0.5TiO3Thin Film Using a Chemical Solution Deposition Method
Acta Scientiarum Naturalium Universitatis SunYatseniVol. 51, Issue 6, (2012)
作者机构:
1. .华南农业大学公共基础课实验教学中心,广东,广州,510642
2. 广东药学院基础学院,广东,广州,510006
3. 韩华新能源(启东)有限公司,江苏,南通,226200
4. 中山大学物理科学与工程技术学院∥光电材料与技术国家重点实验室,广东,广州,510275
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Published:2012,
Published Online:25 November 2012,
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CHEN Ruqi, ZHU Guiwen, LIU Wenfang. Structural and Electrical Properties of Pb0.5Ba0.5TiO3Thin Film Using a Chemical Solution Deposition Method. [J]. Acta Scientiarum Naturalium Universitatis SunYatseni 51(6).(2012)
DOI:
CHEN Ruqi, ZHU Guiwen, LIU Wenfang. Structural and Electrical Properties of Pb0.5Ba0.5TiO3Thin Film Using a Chemical Solution Deposition Method. [J]. Acta Scientiarum Naturalium Universitatis SunYatseni 51(6).(2012)DOI:
Structural and Electrical Properties of Pb0.5Ba0.5TiO3Thin Film Using a Chemical Solution Deposition Method
/Si substrates by using a chemical solution deposition method. The thin films were phasepure with perovskite structure
no secondary phase was observed. Meanwhile
they were smooth
density and crack-free with small grain size of about 17 nm. Good electrical properties were observed in the films annealed at 700 ℃ for 1 h. The dielectric constant and the dissipation factor (at 1 kHz) were 265 and 5 %
respectively. Driven by a electric field of 500 kV/cm
PBT showed 2 Pr of and Ec of 110 kV/cm. These suggested that PBT had potentials in applications of ferroelectric devices.