Femtosecond Laserirradiated Crystallization of Amorphous N:GeSb Film and Its in-Situ Characterization by Coherent Phonon Spectroscopy
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Femtosecond Laserirradiated Crystallization of Amorphous N:GeSb Film and Its in-Situ Characterization by Coherent Phonon Spectroscopy
Acta Scientiarum Naturalium Universitatis SunYatseniVol. 53, Issue 2, Pages: 29-32(2014)
作者机构:
1. 中山大学光电材料与技术国家重点实验室∥物理科学与工程技术学院,广东,广州,510275
2.
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Published:2014,
Published Online:25 March 2014,
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LI Zhongyu, HU Yifeng, WEN Ting, et al. Femtosecond Laserirradiated Crystallization of Amorphous N:GeSb Film and Its in-Situ Characterization by Coherent Phonon Spectroscopy. [J]. Acta Scientiarum Naturalium Universitatis SunYatseni 53(2):29-32(2014)
DOI:
LI Zhongyu, HU Yifeng, WEN Ting, et al. Femtosecond Laserirradiated Crystallization of Amorphous N:GeSb Film and Its in-Situ Characterization by Coherent Phonon Spectroscopy. [J]. Acta Scientiarum Naturalium Universitatis SunYatseni 53(2):29-32(2014)DOI:
Femtosecond Laserirradiated Crystallization of Amorphous N:GeSb Film and Its in-Situ Characterization by Coherent Phonon Spectroscopy
Laser irradiation induced phase change of a new amorphous N:GeSb film is studied by coherent phonon spectroscopy
which is very sensitive to its microstructure. It is found that a new coherent optical phonon(COP) occurs as laser irradiation fluence reaches some threshold
this new phonon also occurs in annealed crystallized N:GeSb film
which proves that the laser irradiation does lead to the crystallization of the N:GeSb film. Pump fluence dependence of COP dynamics of laser-induced crystallized N:GeSb film shows that the frequency and life time of COP decrease as pump energy density increases
which is in accordance with the annealed crystallized N:GeSb film. So it implies the high crystalline quality of the laser-induced phase-change film and the potential application of N:GeSb films in optical phase change memory.