Matching Pursuit Time-frequency Analysis Based on Morlet Wavelet Scale Parameter Optimization
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Matching Pursuit Time-frequency Analysis Based on Morlet Wavelet Scale Parameter Optimization
Acta Scientiarum Naturalium Universitatis SunYatseniVol. 53, Issue 6, Pages: 85-92(2014)
作者机构:
1. 中山大学地球科学与地质工程学院,广东,广州,510275
2.
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Published:2014,
Published Online:25 November 2014,
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FAN Xingli, CHENG Gu. Matching Pursuit Time-frequency Analysis Based on Morlet Wavelet Scale Parameter Optimization. [J]. Acta Scientiarum Naturalium Universitatis SunYatseni 53(6):85-92(2014)
DOI:
FAN Xingli, CHENG Gu. Matching Pursuit Time-frequency Analysis Based on Morlet Wavelet Scale Parameter Optimization. [J]. Acta Scientiarum Naturalium Universitatis SunYatseni 53(6):85-92(2014)DOI:
Matching Pursuit Time-frequency Analysis Based on Morlet Wavelet Scale Parameter Optimization
Matching pursuit time-frequency analysis has better time-frequency resolution compared to short-time Fourier transform
continuous wavelet transform
and generalized S transform
but the traditional greed iterative algorithm has lower computation efficiency. The Morlet wavelet is chosen as timefrequency atoms to achieve the matching pursuit due to the good property of scale parameter. The scale parameter has strong control action on the form of time-frequency atom
thus has strong control action on the matching character between signal and time-frequency atom
through comparing and analyzing the forms of timefrequency atoms based on different scale parameters and the projection values of signal onto different time-frequency atoms with the same frequency
phase and time-delay parameters but different scale parameters. The 1D optimization for scale parameter is done with the frequency
phase and time-delay parameters calculated by Hilbert transform as the parameters of time-frequency atoms. Then the parameters are only needed to be fine-adjusted
and the computation efficiency is improved. The effectiveness of algorithm is tested by model data
and the algorithm is also tested on application of denosing and inversion for thin layer thickness.